Wake Forest University

JEOL 1200 EX

Microscope: JEOL 1200 EX
Service contractor: EM Control
Manager: Carroll (carroldl@wfu.edu)
Location: Suite 10 microscopy
JEOL 1200 EX CTEM
Capabilities
This (1998) instrument has been rebuilt, refurbished, and upgraded (2025), to provide a state-of-the-art, multipurpose platform with excellent contrast for biological as well as materials samples a double condenser projection lens and bright/dark field imaging.
The microscope is managed and maintained by EM Control, a company out of Va with a long history of excellence in microscope management.
Performance
Tungsten Filament
Voltage: 100 kV
Stage: Eucentric goniometer with +/- 60° tilt
Resolution: 0.45 nm
Magnification range: 50x - 1,000,000x,
AMT XR-80 TEM Digital Camera Series: large 8 Megapixel CCD Sensor 50 MHz High Speed, Low Noise Readout GigE Interface

