JEOL 5200 spm | Wake NanoteQ

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JEOL 5200 SPM

scanning probe microscope

The JSPM-5200 is a multi-purpose, high resolution Scanning Probe Microscope (SPM) offering ease of use with diverse measurement and sample environments.

The JSPM-5200 can be used in various native environments - from ambient air, controlled atmosphere, fluid, or vacuum, with the sample heated to 500°C (773°K) or cooled to -143°C (130°K).

The JSPM-5200 can also perform a wide range of applied measurements including the combination of image signals and instantaneous switching between operation modes.

The open architecture of the JSPM-5200 provides multiple access ports and easy access to the probe.

The JSPM-5200 can be configured as either an atomic force microscope (AFM) or scanning tunneling microscope (STM) by merely changing the tip. STM modes include CITS, I-V, S-V, and I-S. Standard AFM modes include contact, friction force microscopy, current image, non-contact and discrete contact with either slope detection or frequency detection, and phase imaging. A patented drift-free stage is implemented to provide an extremely stable imaging platform.

Microscope: JEOL 5200 SPM

Service contractor: JEOL

Manager: Carroll

Location: RM03 microscopy

Features

High resolution allowing observation of atomic and molecular images

The resolution of a SPM is high among various kinds of microscopes. The SPM has a horizontal resolution comparable to the high-resolution TEM and also provides a vertical resolution that surpasses other microscopes. The SPM enables you to easily observe very fine structures, which are not observed using the SEM, without sample treatment.

Double vibration-isolation using air suspension table and gel damper offers the JSPM-5200 offers atomic/molecular resolution images even in noisy environs.

Three AFM modes selectable

The JSPM-5200 comes with three AFM modes: Contact mode, AC mode and Non-Contact mode, enabling you to select a suitable mode depending on the sample or the purpose of measurement.

Non-Contact mode in the standard configuration.

The JSPM-5200 achieves high-resolution imaging without the apex of the probe contacting the sample surface.

Imaging and measurement of physical quantities of sample surfaces.

Various measurement modes

The SPM is used for not only imaging of topographic shapes of samples but also observation and measurement of various physical quantities. In addition to the standard measurement modes including FFM mode and Phase mode, the JSPM-5200 also has surface potential imaging, magnetic force imaging and viscoelasticity imaging.

Environmental SPM: Flexibility in sample environments

The SPM can control the sample environment. You can use the JSPM-5200 in various environments such as air, vacuum, controlled atmospheres and liquid. This SPM flexibly controls the sample environment, enabling you to observe samples not only in vacuum, controlled atmospheres and liquid, but also while heating or cooling them.

Simple, consistent operation

Simple operation with the JSPM-5200 does not change even when you install optional sample heating or cooling accessories in vacuum or in air. The JSPM-5200 is easy to operate in all sample environments. You can observe the sample image soon after inserting the sample in the JSPM-5200.

Operation by only clicking icon buttons

When you insert the sample in the JSPM-5200, you can easily observe the sample image by just clicking the clearly labeled icon buttons in the measurement software. This measurement software automatically performs all necessary tuning of the components (cantilever, etc.) for measurement.

Image processing→ analysis→ report creation – integrated into one function

Specifications

Resolution AFM: Atomic resolution (mica with the contact mode)

STM: Atomic resolution (HOPG atomic image)

System drift 0.05 nm/s or less, drift-free stage available

Measurement mode (AFM) AFM Contact mode

　Topography image, Force image

　Focus curve, Friction force curve, I-V, CITS,

　Contact current image, SPS mapping

AC mode

　Topography image, Phase image, Amplitude image

　Point by point MFM

Non-Contact mode (FM mode)

　Topography image, Frequency image

Measurement mode (STM) STM mode

　Topography image, Current image, CITS

　I-V, S-V, I-S

Scan range XY : 0 to 20 μm (standard scanner)

　　Resolution: 25 bits (including offset)

Z : 0 to 3 μm (standard scanner)

　　Resolution: 21 bits (at a gain of ×32)

Sample size Up to 50 mm×50 mm×5 mm (T)

Standard: 10 mm×10 mm×3 mm (T)