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NanoteQ
Imaging and Microanalysis Facility

IAF

Training and Certification  are required to use the equipment. User workshops and classes are offered regularly and by request. Assistance and full microscopy services are also available. For access contact:  carroldl@wfu.edu

image sourced online

Electron Microscopes

Scanning Probe Microscopes

JEOL JSPM 5200 Atomic Force Microscope

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RHK UHV VT Scanning Tunneling Microscope

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Veeco / Digital Instruments Dimension 3100 AFM

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XPS - Auger

PHI 570 - RBD Scanning Auger and XPS system

X-Ray Photoelectron Spectroscopy (XPS) Surface Analysis / ESCA and Auger Electron Spectroscopy (AES)

 

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DIC Optical Microscopy

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Olympus VANOX

Differential interference contrast (DIC) microscopy, also known as Nomarski interference contrast (NIC) or Nomarski microscopy

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this one is not ours but it is a better image

DIC of under-exposed resist

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