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the Wake Forest University
Microscopy and Microanalysis Facility
Training and Certification  are required to use the equipment. User workshops and classes are offered regularly and by request. 

Assistance and full microscopy services are available through the various Nanotech Center Groups. 

For access contact:
image sourced online

The Instruments
there are multiple core instruments for use in the microscopy facility

Electron Microscopes

Scanning Probe Microscopes

JEOL JSPM 5200 Atomic Force Microscope

RHK UHV VT Scanning Tunneling Microscope

XPS - Auger

PHI 570 Scanning Auger and XPS system

X-Ray Photoelectron Spectroscopy (XPS) Surface Analysis / ESCA and Auger Electron Spectroscopy (AES)


Optical Microscopy

Olympus BX-51

Olympus Vanox


4pi Confocal

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