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NanoteQ
Electron Imaging and Microanalysis Facility
IMAF
Training and Certification are required to use the equipment. User workshops and classes are offered regularly and by request. Assistance and full microscopy services are also available. For access contact: carroldl@wfu.edu
image sourced online
Electron Microscopes
Scanning Probe Microscopes
XPS - Auger
PHI 570 - RBD Scanning Auger and XPS system
X-Ray Photoelectron Spectroscopy (XPS) Surface Analysis / ESCA and Auger Electron Spectroscopy (AES)
Optical Microscopy
Olympus BX-51
Olympus Vanox
4pi Confocal
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