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Microscopy home

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Sample prep lab

 

JEOL 2010F

JEOL 1200 EX

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JEOL 6330F

Hitachi 4700 F

Hitachi 3000

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RHK VT SPM100

JEOL 5200 SPM

DI/Veeco 3100 SPM

 

PHI XPS

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Olympus Vanox DIC

Olympus Vanox Fluor.

Digital Instruments/Veeco Dimension 3100 SPM

scanning probe microscope

 

Atomic Force Microscopy (AFM) is a high resolution scanning probe microscope with resolution on the order of sub nanometer. The AFM consist of a cantilever with a sharp tip used to scan the surface of a sample.

 

Our Veeco Dimension 3100 AFM

Sample size 150 mm diameter 12 mm thick

Stage movement x-y 150 mm with 2 micron resolution

Video optics with zoom 150-675 micron viewing area

Piezo scan head range; 90 micron x-y and 6 micron in z

16 bits DAC giving sub nanometer resolution

Max 512 x 512 samples/image

Contact and tapping mode AFM

Conductive AFM

STM

Liquid cell

Microscope:              DI 3100 SPM

​Service contractor:  AFM Services

Manager:                  Carroll​

Location: â€‹                  RM02 microscopy 

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Resources

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Documents

 

Instructions I​

Instructions II

Getting Started

 

Dimension 3100

 

The Dimension 3100 is capable of that the Dimension 3000, however where the 3100 outperforms the 3000 is in its repeatability. The improved stage controller allows for superior repeatability by more accurately locating the desired scanning area of a sample.

 

Key Specifications:

 

Noise:  <0.5 Å RMS in vertical (Z) dimension when used with an optional vibration isolation system. (75 dbc ambient white noise)

 

Microscope:

 

Lateral accuracy typically within 1%, Maximum 2%

Provides full 16-bit resolution on all axes for all scan sizes and offsets

Tip/Sample Viewing: 180 to 810 μm optical field of view

Motorized zoom and focus

2 μm (highest) resolution at smallest field of view

X-Y Stage: 100 mm by 120 mm inspectable area

2 μm linear positioning resolution

4 μm in the X-direction and 6 μm in the Y-direction for bidirectional repeatability

Sample Size: ≤ 200 mm diameter wafer with X-Y stage

12 mm thick (taller samples can be accommodated with customized chucks)

 

Power: 1800 W peak consumption

100, 120 or 220-240 V single phase

50 or 60 Hz

 

Recommended hardware for a optimal system:

Nanoscope IIIa, Windows 7

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© 2025 by NanoteQ @ Wake.

 

Wake Forest University is a small, selective, research university located in Winston-Salem NC. It has  a long tradition of innovation in the biomedical and physical sciences.  NanoteQ is a unit of WFU serving as a university-wide  central facility for specialized equipment and capabilities. Images and data content of this website are the property of WFU and its affiliate colleges. NanoteQ @ Wake reserves editorial right of access to commentary on these pages. Opinions expressed are not those of the University and the site does not represent binding policy by the University.

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