The JEOL 2010F

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Capabilities

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WFU's high resolution capabilities are centered on our JEOL 2010F. This 2003 instrument was rebuilt, refurbished, and upgraded in 2025. The system's analytical capabilities come from EDS X-ray analysis as well as a Gatan image filter (GIF) for EELS and energy filtered imaging. A scanning image observation device (ASID), and several CCD cameras are available for various applications.

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With its resolution and stability, the 2010F and its cousins in the 2100F family of microscopes remain some of the highest performing non-aberration corrected microscopes available, ideal for systems in which aberration correction is less necessary such as Chalcogenides, Si, etc. a but high degree of beam stability and energy resolution is desired.

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The microscope is managed and maintained by EM Control, a company out of Va with a long history of excellence in microscope management.

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Resolution

 

CTEM 0.10 nm lattice / 0.19 nm point-to-point
STEM 0.16 nm high angle annular dark field (HAADF)

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Work Packages

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(1) Cameras and Detectors

(i) Gatan MultiScan Camera (model 794) & MultiScan Camera (model 794 IF);

(ii) Fischione HAADF detector

(iii) Oxford Inca EDS detector

(iv) Gatan GIF 2000 EELS spectrometer

 

(2) Sample holders

(i) JEOL single-tilt holder,

(ii) JEOL double-tilt holder, Model: EM-31041  

(iii) GATAN 912 Ultra High Tilt Tomography Holder, Model: 912.J2915,  

(iv) GATAN 636 Cooling In-situ Holder, Model: 636-J0915J03. ​​