JEOL 2010F STEM
0.19 nm point‐to‐point imaging resolution
(1) Cameras and Detectors
(i) Gatan MultiScan Camera (model 794) & MultiScan Camera (model 794 IF);
(ii) Fischione HAADF detector
(iii) Oxford EDS detector
(iv) Gatan GIF 2000 EELS spectrometer
(2) Sample holders
(i) JEOL single-tilt holder,
(ii) JEOL double-tilt holder, Model: EM-31041
(iii) GATAN 912 Ultra High Tilt Tomography Holder, Model: 912.J2915,
(iv) GATAN 636 Cooling In-situ Holder, Model: 636-J0915J03.
Cost
$50/hr. $100/hr. $200/hr. (Schedule A)
internal/external/service
Capabilities
• Fischione HAADF detector for Z‐contrast STEM, Images/video are captured by CCD camera
• Oxford INCA EDX system equipped for compositional profiling and mapping
• GATAN GIF 2000 EELS spectrometer sensitive for light element analysis and mapping
• SAD for crystal phase structural analysis
• High‐angle annular dark‐field (HAADF) STEM detector for approved atomic number (Z) image contrast, useful for composite and catalyst research