top of page
logo final.png

Microscopy home

​

Sample prep lab

 

JEOL 2010F

JEOL 1200 EX

​

JEOL 6330F

Hitachi 4700 F

Hitachi 3000

​

RHK VT SPM100

JEOL 5200 SPM

DI/Veeco 3100 SPM

 

PHI XPS

​

Olympus Vanox DIC

Olympus Vanox Fluor.

JEOL 2010F STEM

high resolution scanning transmission electron microscope

 

Resolution

CTEM 0.10 nm lattice / 0.19 nm point-to-point
STEM 0.16 nm high angle annular dark field (HAADF)

​​

(1) Cameras and Detectors

(i) Gatan MultiScan Camera (model 794) & MultiScan Camera (model 794 IF);

(ii) Fischione HAADF detector

(iii) Oxford Inca EDS detector

(iv) Gatan GIF 2000 EELS spectrometer

 

(2) Sample holders

(i) JEOL single-tilt holder,

(ii) JEOL double-tilt holder, Model: EM-31041  

(iii) GATAN 912 Ultra High Tilt Tomography Holder, Model: 912.J2915,  

(iv) GATAN 636 Cooling In-situ Holder, Model: 636-J0915J03. â€‹â€‹

Microscope:              JEOL 2010F

​Service contractor:  EM Control

Manager:                  Carroll​

Location: â€‹                  RM1 microscopy 

​

​

​

​

​

 

2010F_edited.jpg
Screen Shot 2022-09-19 at 3.35.37 PM.png

Capabilities

​​

This (build date 2003) instrument is a rebuilt, refurbished, and upgraded (2025), multipurpose high resolution analytical electron microscope. It has high resolution image quality and high analytical performance from EDS X-ray analysis as well as a Gatan image filter (GIF) for EELS and energy filtered imaging. A scanning image observation device (ASID), and several CCD cameras are available for various applications.

​

With its resolution and stability, the 2010F and its cousins in the 2100F family of microscopes remain some of the highest performing non-aberration corrected microscopes available, ideal for systems in which aberration correction is less necessary such as Chalcogenides, Si, etc.  a but high degree of beam stability and energy resolution is desired.

​

The microscope is managed and maintained by EM Control, a company out of Va with a long history of excellence in microscope management.

Resources

​​​​

​Alignment procedures​​​​

SOP​​

​Z-Contrast Atomic Resolution

​

Si undergoing reconstruction at high temp. on a 2010F at UF

wake-forest-logo_edited.png

© 2025 by NanoteQ @ Wake.

 

Wake Forest University is a small, selective, research university located in Winston-Salem NC. It has  a long tradition of innovation in the biomedical and physical sciences.  NanoteQ is a unit of WFU serving as a university-wide  central facility for specialized equipment and capabilities. Images and data content of this website are the property of WFU and its affiliate colleges. NanoteQ @ Wake reserves editorial right of access to commentary on these pages. Opinions expressed are not those of the University and the site does not represent binding policy by the University.

Picture1.png
bottom of page