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the Wake Forest University - Nano and Quantum Technologies Laboratory
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Sample prep lab
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RHK VT SPM100
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Olympus Vanox DIC
Olympus Vanox Fluor.
JEOL 2010F STEM
high resolution scanning transmission electron microscope
Resolution
CTEM 0.10 nm lattice / 0.19 nm point-to-point
STEM 0.16 nm high angle annular dark field (HAADF)
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(1) Cameras and Detectors
(i) Gatan MultiScan Camera (model 794) & MultiScan Camera (model 794 IF);
(ii) Fischione HAADF detector
(iii) Oxford Inca EDS detector
(iv) Gatan GIF 2000 EELS spectrometer
(2) Sample holders
(i) JEOL single-tilt holder,
(ii) JEOL double-tilt holder, Model: EM-31041
(iii) GATAN 912 Ultra High Tilt Tomography Holder, Model: 912.J2915,
(iv) GATAN 636 Cooling In-situ Holder, Model: 636-J0915J03. ​​
Microscope: JEOL 2010F
​Service contractor: EM Control
Manager: Carroll​
Location: ​ RM1 microscopy
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Capabilities
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This (build date 2003) instrument is a rebuilt, refurbished, and upgraded (2025), multipurpose high resolution analytical electron microscope. It has high resolution image quality and high analytical performance from EDS X-ray analysis as well as a Gatan image filter (GIF) for EELS and energy filtered imaging. A scanning image observation device (ASID), and several CCD cameras are available for various applications.
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With its resolution and stability, the 2010F and its cousins in the 2100F family of microscopes remain some of the highest performing non-aberration corrected microscopes available, ideal for systems in which aberration correction is less necessary such as Chalcogenides, Si, etc. a but high degree of beam stability and energy resolution is desired.
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The microscope is managed and maintained by EM Control, a company out of Va with a long history of excellence in microscope management.
Resources
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​Alignment procedures​​​​
SOP​​
​Z-Contrast Atomic Resolution
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Si undergoing reconstruction at high temp. on a 2010F at UF