Big changes are coming to the WFU microscopy suite.
Microscopy has become an ALL JEOL facility with the acquisition of its new JEOL 2010F STEM. This system is loaded for materials science:
Base
1. 200kV maximum accelerating voltage with semi-continuous HV control, 50eV/step
minimum
2. Electron Gun Assembly
Schottky FEG Emitter - Zr/W<100>
Emitter temperature: 1600-1800K
Probe current approximately 0.5nA/1nm (at FWHM)
3. FasTEM System
FasTEM provides complete fast external computer control of all microscope
operating conditions and specimen stage (x and y translation).
4. Specimen Anticontamination Trap
5. Differential Vacuum System utilizing Sputter Ion and Diffusion Pumps,
Microprocessor Controlled, featuring "radial evacuation" of the specimen area
6. Eucentric Motorized 5 axis Side Entry Goniometer:
Side Entry Goniometer
Analytical (ARP) Pole Piece
0.23nm, ±30 deg tilt x or y; 0.12 steradian solid angle; 25° take-off angle
Encoded X, Y, Z and tilt axes
7. Independently controlled condenser mini lens to allow variable convergence angle
selection (JEOL alpha sector)
8. High Contrast Objective Aperture (Lower position in the Objective Lens) for high
contrast imaging and/or simultaneous EDS/high resolution/high contrast imaging
9. Independent Lens "Free Run" Control
10. Optimum under focus with variable focus step
11. Automatic through focus
12. Beam Stop
13. Automatic Exposure System for allowing variability of either brightness or time
(electron current measuring type with both average and spot metering)
Peripheral Equipment
1. Jeol SCANNING IMAGE OBSERVATION DEVICE/ASID (EM-24015)
2. EDAX PHOENIX EDS SYSTEM WITH RETRACTABLE SUTW TEM DETECTOR
Super Ultra Thin Window for the detection of elements down to and including
Beryllium (Z=4)
Resolution 136 eV or better measured at 5.9keV / at 1000cps
Peak to Background 18000:1 or better
Including preamplifier and cables, and bellows for auto - retraction
High voltage cut-off switch
Si(Li) type with active area 30mm2
Microanalysis
1. QUANTITATIVE THIN FILM TEM MICROANALYSIS SOFTWARE FOR
MATERIALS APPLICATIONS : (This is only available from within the EDAX Genesis
Software Application)
State of the art AEM algorithms
Cliff-Lorimer and thin film approx imation methods
Experimental and theoretical K-factor determination
K-factor tables stored to disc
Choice of methods for theoretical cross sections
Thin film absorption correction selectable when needed
Thin film fluorescence correction selectable when needed
Ox ide stoichiometry calculation routines
Automatic mode for single key operation
Integrated acquisition, storage, identification,background subtraction and spectrum
processing
2. PHOENIX EDAM III ANALYZER :
Multi-Channel Analyzer
Sixteen Digital SCA Outputs
Dedicated high speed PCI bus
8 software selectable time constants
Two Independent High Voltage channels
Peak Shift correction for input count rate
Triple level fast discriminator
3. Gatan Imaging Filter (GIF 2001) operating up to 200keV with grade B 1k x 1k
CCD with the following Gatan items:
The GIF 2000 family (2001 & 2002) is the 2nd generation post column energy filter
series and is optimized for operation at primary energies from 200 to 400keV. Similar
to first generation post column energy filters from Gatan, these GIFs can be
attached to the bottom flange of any modern TEM (FEG or Lab6) to form energy
filtered images, diffraction patterns, and energy loss spectra. The 2nd generation
electron optics of the GIF 2000 family offers fully 2nd order corrected prisms and 3rd
order corrections for the major aberrations in the image.
805 Pneumatic BF/DF STEM system
679.34CK STEM interface electronics
700.20P25 HREM software used for autofocus, autostigmation, and auto
alignment. (PC)
678.35XXX Gate valve controller
795-692.U Upgrade 2k camera housing
788 DigiScan II
820.30000 FireWire adapter for DigiScan II & 794/20 MegaScan CCD
794.80V14 DigitalMicrograph software plug-in for 794/20 MegaScan
700.80P10 Digita1Montage software (PC)
703.0012P Spectrum imaging base package (PC)
703.4011P STEM EELS spectrum imaging (PC)
703.2010P EFTEM Spectrum Imaging module (PC)
703.3010P X-ray Spectrum Imaging module (PC) (EDAX EDS)
700.80P14 Software plug-in for 780 DualView
EM-28060 JEOL 2010 Vibration Isolators for GIF
EM-20440 JEOL 2010 Function for GIF (ARP polepiece)
07976 PCI kit for installing the 780 DualView on the GIF computer
4. Gatan Megascan camera with Grade B 2k x 2k CCD. This is a bottom mount
camera located under the Jeol camera chamber and interfaced with the Gatan
camera housing.
5. Gatan 780 DualVision camera mounted in the 35mm port. This camera provides a
large field-of-view (great low magnification imaging)with simultaneous digital and
video TEM imaging. The camera can be manually rotated through 360 degrees and
provides images up to 1300 x 1030 pixels with 12-bit dynamic range.
TEM Sample Holders
The Gatan holders include a beryllium Hex ring ,beryllium anti-twist washer, one
Hexring tool,one loading jig assembly (for the 925 model), and a specimen rod stand
to facilitate specimen loading under a stereo microscope
1. Gatan 646 Double-Tilt Analytical Holder
The cradle has a continuous manual rotation in both directions of 360 degrees
The cradle may be tilted manually ±25° (pole piece dependent)
Tilt and rotation may be separately adjusted at any orientation of the specimen
cradle
Beryllium specimen cup and Hexrings are provided to minimize the x - ray
background during EDX analysis
2. Gatan 646-0300 Second Axis Tilt Control
“But this is just the beginning of the upgrades to Wake's imaging facility”
The Nanotech Center continues to upgrade and push the envelope of capabilities in electron imaging. This MPEG from Sean is an example...