JEOL JSPM 5200 Atomic Force Microscope

 

The JSPM-5200 can be used in air, controlled atmosphere, fluid, or vacuum at temps of of 500° C (773K) to -143° C (130K). It can be configured as an AFM or STM. STM modes include CITS, I-V, S-V, and I-S. Standard AFM modes include contact, magnetic force, friction force microscopy, current image, non-contact and discrete contact with either slope detection or frequency detection, and phase imaging. 

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Veeco Digital Instruments Dimension 3100

 

Atomic Force Microscopy (AFM) is a high resolution scanning probe microscope with resolution on the order of sub nanometer. The AFM consist of a cantilever with a sharp tip used to scan the surface of a sample.

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For our Veeco Dimension 3100 AFM:

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Sample size 150 mm diameter 12 mm thick

Stage movement x-y 150 mm with 2 micron resolution

Video optics with zoom 150-675 micron viewing area

Piezo scan head range; 90 micron x-y and 6 micron in z

16 bits DAC giving sub nanometer resolution

Max 512 x 512 samples/image

Contact and tapping mode AFM

Conductive AFM

STM

Liquid cell

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