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Optical Device Testing
a core lab of Nanotech
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Lighting Devices


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Solar Devices

OPV, a-Si:H, cSi, thermal-solar, stretchable solar, polymer development, small molecule on large area. 


Inert Atmosphere Testing

Outdoor testing to testing in controlled environments. 25:75 testing, lifetimes, and lifecycle.

The Nanotech Center hosts several groups doing research in lighting and solar technologies. They have produced a surprising number of patents in these fields.

Prototyping and testing from devices to panels. The Nanotech Center offers a comprehensive technology development environment for lighting and solar. 

Solar Testing


Laterally mounted AM1.5g standard testing setup allows the researcher to test angular response of a solar collection device from +90 to -90 degrees.  Air Mass is adjusted through filters to match changes in spectral content.


AM1.5g Class A standard simulator

This “top down” mounted simulator provides he most exact measurement of cell performance conforming to the ASTM E927-05 standard.  The Class A has a Spectral Match (each interval) 0.75 - 1.25, Irradiance Spatial Non-Uniformity 2% and Irradiance Temporal Instability 2%.  Temperature control is available with this instrument.  Certification / calibration certificates are available. 


QE/IPCE Measurement Kit

Used for solar cell QE/IPCE measurements.  Simple, yet flexible software that measures QE with a simple configuration setup. 300 W Xe light sources.  All components from Newport which makes support easy Digital lock-in measurements with a NIST calibrated detectors over the 350 – 1100 nm range. Multiple Solar cell fixtures are available.


The WFU outdoor testing facility

This facility is currently under construction.  It will include weather and ambient conditions stations, mountings for commercial scale panels, and centralized data collection.

Lighting and Display

An important part of NanoCenter’s optical metrology capabilities is the characterization of emitting devices.  The Center maintains calibrated and certified capabilities in:


  1. color scaling (CIE, CRI - temperature), 

  2. power and internal conversion efficiencies, 

  3. spectral analysis and contrast for display characteristics, 

  4. lifetime testing, 

  5. illumination patterns for general illumination sources.