top of page
jeol_jsm-6340f_987495.JPG

JEOL 6340F SEM

In-lens secondary electron detector

Resolution: 2.5nm at 1kV 1.2nm at 20kV

Sample size: 4" X-Direction: 50 mm Y-Direction: 70 mm

Chamber: Airlock, 4" LN2 cold trap

EDX Capabilities Chamber camera & monitor X-Stream imaging system

Operating system: Windows XP Image capture & networking capability.

bottom of page