JEOL 6330F SEM

​

Electron beam energy: 0.2-30 keV,

Resolution: 1.5 nm,

Magnification: 500,000x,

3D imaging package,

 

Sputter coater and carbon coater available.

 

Energy dispersive spectrometer (EDS), X-Ray range: 0.15-30 keV Energy resolution.

​

Cost: Schedule A

​